Core competence | Analysis of materials and surfaces | |
Method | SPM | |
Contact person | ||
Publications |
Szakmai leírás
Scanning Probe Microscopy (SPM) is a group of methods, like Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM), that uses a probe to sense a probe to surface atom interaction. By two dimensional scanning of the probe on the surface in Ultra High Vacuum (UHV) condition reveals atomic resolution microscopic image.